SNU PRECISION
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Core Technology

The advanced technology of SNU Precision is opening the future.

Product introduction

CDHT

CDHT

Introduction Halftone and CD are simultaneously measured to optimize process conditions such as exposure amount, coating amount, and etching amount in LCD process
Features Simultaneous measurement of CD / thickness / height in one measurement
Nano-level resolution, high-speed measurement
Measurement Item: Halftone thickness, Overlay, Hole, PR, Metal, ITO Slit line width measurement etc.
Application TFT Photo process, TFT PECVD process, Flexible TFT substrate PI thickness measurement