LCD
PSIS
Halftone CD
AMS
MPIS
SDIS
Auto Micro
Review Repair
PTMS
OLED
Solar Photovoltaic
Optical Measurement
Semiconductor
 
Description

SNU¡¯s unique machine that monitors TFT line
processing can do simultaneously measurement
of Halftone thickness and CD on TFT panel

Features
  1. None destructive.
  2. Halftone thickness measurement
  3. Halftone, ITO CD, PR ThicknessGLS Edge
    to align-key distance measurement
Application Array process