LCD
PSIS
Halftone CD
AMS
MPIS
SDIS
Auto Micro
Review Repair
PTMS
OLED
Solar Photovoltaic
Optical Measurement
Semiconductor
 
Description

Examination of glass alignment of TFT and
Color Filter by checking overlay key located on
the glass and feeding back contributes to increase
yield.

Features
  1. Accurate recognition of both of CF and TFT
    class by Z axis Scanning
  2. Overlay Key Dx & Dy, Vernier Key
Application Cell process