LCD
PSIS
Halftone CD
AMS
MPIS
SDIS
Auto Micro
Review Repair
PTMS
OLED
Solar Photovoltaic
Optical Measurement
Semiconductor
 
Description

Particle on glass is very harmful to mask of
proximate exposure.
This solution prevents mask from unexpected
damage of mask.

Features

Whole glass scan
Fast tact time,
Variety of installation configuration such as inside exposure, over conveyor or over HCP.

Application

Proximate exposure process,
rocation of Particle Inspection.