2D Measurement
- MVS-300
- GMS-1000
- WIS-D250
3D Measurement
- SIS-Series
- SNU AFM-100
- CHM-250
Fiber Optic Inspection
- FIS-100
- FIS-200
- DIS-100
- SIS-700
Product Consultation



SNU Precision developed the WIS-D250 with long experience of optics and measurement technology.
The WIS-D250 inspects all patterns, shapes and defects of wafer with sub micron accuracy.
It aligns inspects wafer automatically after loading Cad file.
   
Non-destructive Measurement
Multiple Fiels-of view Lens
Fast Measurement and Ease of Use
   

   
Wafer Pattern Inspection (Height, Width, Area, Angle...)
Wafer Defect Detection & Classification (Dust, Scratch, Residuals...)
   

Measurement Function Geometry Features, Moment Features
Fine Alignment Alogirithm, Pattern Inspection,Defect Detection & Classification
Wafer Information Loading, Report/Save,Auto Pattern Inspection and semi Auto Inspection
Optics 640 X 480 Progressive B/W CCD Camera,
Motorized revolving nosepiece with 5 holes
Stage Fixed Stage with Vertical Axis (250 X 250 X 100mm)
Main Body Material: Granite Assembly (500 X 500 X 100mm)
Vibration Isolation Table High Quality Air Spring Included.(600 X 600 X 800mm)
Processor Pentium IV Processor, 1G Ram, 40G HDD
Monitor 17" TFT LCD Monitor OS Windows2000 Dimension 600 X 600 X 1400mm
Specification Rotation X-Axis Y-Axis Z-Axis
Material Granite Assembly / Moving Part : AI6061-T6
Finishes Hard Anodized
Drive Mechanism Direct Drive Linear Motor Linear Motor Precision Ball Screw
Bearings   Cross Roller Guide Cross Roller Guide Cross Roller Guide
Motors DD Servo Motor Linear Motor Linear Motor Rotary Servo Motor
Feedback Rotary Encoder Linear Encoder Linear Encoder Linear Encoder
Total Travel   250mm 250mm 100mm
Encoder Resolution 655,360(p/rev) 0.2um 0.2um 0.2um
Accuracy
(after calibration by Laser Interferometer)
¡¾15arcsec ¡¾3um ¡¾3um ¡¾3um
Repeatability ¡¾2arcsec ¡¾1um ¡¾1um ¡¾1um
Max.Velocity   200mm/s 200mm/s 100mm/s
Inspection Time < 30 frames / 1 sec
Revolver Motorized revolving nosepiece with 5 holes
Minimum Defect Size < 0.6um (50 x Magnification) / 0.2um (DUV Optic)
Data Points 307,200 Points (640 x 480)
Optics 5 X 10 X 20 X 50 X 100 X
Field of View[um] 1760 X 1320 880 X 660 440 X 330 176 X 132 88 X 66
Working Distance[mm] 12 6.5 3 10.6 3.4
Spatial Sampling 1.28 0.64 0.32 0.13 0.06
Light Source Halogen Lamp