2D Measurement
- MVS-300
- GMS-1000
- WIS-D250
3D Measurement
- SIS-Series
- SNU AFM-100
- CHM-250
Fiber Optic Inspection
- FIS-100
- FIS-200
- DIS-100
- SIS-700
Product Consultation



   
Use of laser-beam system for detecting the probe position and torsion
Operation in static and dynamic mode
Digital scanning control system
Positioning of the sample under probe
Embedding a CCD camera for observing the probe and scanned area on the
sample surface
Modular structure of the control electric unit and software
   

Operation Mode    Contact static AFM / Non-contact dynamic AFM
Scanning Area 25 * 25 um
Scanning matrix size Up to 1024 points
Lateral Resolution 1 nm
Vertical Resolution 0.1 nm